Thin films are widely used in a variety of applications and the Thin-Film Measurement System can easily determine their properties. Based on interference spectral analysis of multi-reflection beams, this instrument functions non-contact optical measurement of thickness, refractive index, and extinction coefficient of various thin films and coatings.
With dedicated hardware design and program development, this measurement system is easy to setup and the software is user friendly. It is suitable for both on-line manufacturing and desktop measuring.
With the ability to connect to your microscope to reduce the spot size or to dismantle for solely spectroscopic use, the Thin-Film Measurement System really is your solution to your measurement problems.